In-Circuit Test (ICT) System


The E9903D i307x has the largest node count coverage of the i3070 family of combinational testers designed to provide in-circuit test capability coupled with additional capabilities to ensure high test coverage of today's complex electronic assemblies.

All Medalist i3070 test systems are able to accept both Mux pin cards as well as UnMux pin cards. This is to provide you more flexibility in the use of this system.

  Analog Plus (Mux) Access Plus (Mux) Hybrid Plus (Mux) Hybrid 144 (Unmux)
Test nodes per card 144 8 x High Frequency
10:28 instrument ports
24 x GP Relays
144 144
Digital channels per card N/A N/A 16 144
Max pattern rate/frequency N/A HF: 100MHz
Inst Ports: 25MHz
GP Relays: N/A
6/12/20 MPS 6 MPS
Maximum cards per module/system** 9/36 9/36 9/36 9/36
Analog voltage range 0-100V 0-100V 0-100V 0-100V
Digital Drive/Receive range N/A N/A -3.5 to 5.0V 0 to 4.75V
Edge Placement Accuracy N/A N/A +/- 10 nS +/- 10 nS
** Total pin cards cannot exceed 9 pin cards/module



Technical specifications I3070